Structured light metrology systems provide a precise and efficient digital reconstruction of real-world objects through projected light patterns and a camera system. These digital images form the processing data for fabrication systems. Structured light scanners require a time-sensitive manual setting of the input parameters that result from the measurements of the real-world objects. What is needed is a method to automate a robust search for optimal exposure time with minimal human intervention and judgment.
LLNL’s novel approach utilizes a number of techniques to improve reconstruction accuracy:
- Better coding scheme-based techniques
- Hardware-assisted techniques
- Adaptive fringe projection techniques
- Multi-exposure based techniques
The method requires specific calibration procedures and control of the hardware, which is achieved through a digital twin of the metrology system and a defined “coverage quality metric” to evaluate the measurement data sets.
For further details:
Building better materials with data science (VIDEO) | Data Science Institute (https://data-science.llnl.gov/latest/news/building-better-materials-data-science-video)
Research Spotlight: Digital Twins | Data Science Institute (https://data-science.llnl.gov/research-areas/materials/digital-twins)
This technology is associated with the Structured Light Metrology (SLM) Toolkit, or 'SLMkit'. For more information about this software, go to https://softwarelicensing.llnl.gov/product/slmkit-the-structured-light-metrology-toolkit
Image caption: A digital twin (right) is the virtual representation of real-world objects and processes (left)
Current stage of technology development: TRL 6 (engineering system validation in relevant environment). The functionality of the invention has been tested successfully.
LLNL has filed for patent protection on this technology.
- Manufacturing costs can be reduced due to automated 3D scanning.
- For operators of structured light scanners, the novel method can automate the selection of exposure time for repeated scanning.
- For digital twin developers of structured light scanners, the technology can add optimal exposure times to the digital twin.
- For manufacturers of structured light scanners, LLNL’s digital twin approach extends the possibilities of automation processing for the optical metrology technique.
- 3D scanning/imaging
- Digital twin development
