Skip to main content
Image
Flash Stock Image

This invention proposes achieving the same effect of a single, high intensity pulse through the use of a closely spaced burst of short duration pulses. By keeping the intensity of the individual pulses below the damage threshold the risk of catastrophic damage is greatly mitigated. Additionally, the pulses are directed to strike the target at locations temporally and spatially sufficiently…

Image
Left to right: Drew Willard, Brendan Reagan, and Issa Tamer work on the Tm:YLF laser system. Photos by Jason Laurea

This invention proposes the use of a nonlinear spectral broadening subsystem as a post-CPA pulse compression add-on for high energy laser systems. The proposed solution utilizes the beam profile of a high peak power laser as a reference to shape a highly transmissive nonlinear plastic (e.g., CR39) itself to ensure a spatially homogeneous nonlinear spectral broadening.

Image
SEM image of a prototype for a neural implant shuttle etched into a non-SOI wafer. The 7:1 (Si:Photoresist) etch selectivity used here allowed for a maximum structure height of 32 μm, with up to 75 steps of 0.4 μm height each. Scale bar 100 μm.

For this method, a Silicon on Insulator (SOI) wafer is used to tailor etch rates and thickness in initial steps of the process.  The simple three step process approach is comprised of grayscale lithography, deep reactive-ion etch (DRIE) and liftoff of the SOI wafer.  The liftoff process is used to dissolve the insulating layer, thus separating sections of the wafer as individual…