LLNL researchers have developed a TDLAS-based, standalone, real-time gas analyzer in a small form-factor for continuous or single-point monitoring. The system can analyze multiple gases with ultra-high sensitivity (ppm detection levels) in harsh conditions when utilizing wavelength-modulation spectroscopy (WMS).
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![SEM image of a prototype for a neural implant shuttle etched into a non-SOI wafer. The 7:1 (Si:Photoresist) etch selectivity used here allowed for a maximum structure height of 32 μm, with up to 75 steps of 0.4 μm height each. Scale bar 100 μm.](/sites/default/files/styles/scale_exact_400x400_/public/2023-05/SEM%20image%20prototype%20neural%20implant%20shuttle.png?itok=fpnfB5Yr)
For this method, a Silicon on Insulator (SOI) wafer is used to tailor etch rates and thickness in initial steps of the process. The simple three step process approach is comprised of grayscale lithography, deep reactive-ion etch (DRIE) and liftoff of the SOI wafer. The liftoff process is used to dissolve the insulating layer, thus separating sections of the wafer as individual silicon…
![Schematic of 2P3C setup. Pump laser component is in red while probe laser component is denoted in blue.](/sites/default/files/styles/scale_exact_400x400_/public/2023-05/trace%20gas%20detection%20with%202P3C%20ring-down%20spectroscopy_0.jpg?itok=FcMiekn3)
LLNL’s novel approach combines 2-color spectroscopy with CRDS, a combination not previously utilized.
![Intrinsic Use Control](/sites/default/files/styles/scale_exact_400x400_/public/2022-06/Intrinsic%20Use%20Control.jpg?itok=plVEiBwC)
LLNL's method of equivalent time sampling incorporates an embedded system that generates the pulses used to trigger the external circuit and the data acquisition (DAQ). This removes the external reference clock, allowing the overall system clock rate to change based on the ability of the embedded system. The time delays needed to create the time stepping for equivalent time sampling is done by…
![drift_meter_thumb.jpg drift_meter_thumb](/sites/default/files/styles/scale_exact_400x400_/public/2019-08/drift_meter_thumb.jpg?itok=1NiNsyHm)
LLNL’s Optically-based Interstory Drift Meter System provides a means to accurately measure the dynamic interstory drift of a vibrating building (or other structure) during earthquake shaking. This technology addresses many of the shortcomings associated with traditional strong motion accelerometer based building monitoring.
LLNL’s discrete diode position sensitive device is a newly…
![Electronic Wave](/sites/default/files/styles/scale_exact_400x400_/public/2022-06/electronic%20wave.jpg?itok=v7aKMJKH)
The invention relates to a measurement method and system for capturing both the amplitude and phase temporal profile of a transient waveform or a selected number of consecutive waveforms having bandwidths of up to about 10 THz in a single shot or in a high repetition rate mode. The invention consists of an optical preprocessor which can then output a time-scaled replica of the input signal to…
![microcantilever3.jpg microcantilever3](/sites/default/files/styles/scale_exact_400x400_/public/2019-08/microcantilever3.jpg?itok=NKaBhMlG)
LLNL has developed a compact and low-power cantilever-based sensor array, which has been used to detect various vapor-phase analytes. For further information on the latest developments, see the article "Sniffing the Air with an Electronic Nose."